PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Expertise isn't easy to pass down. Take riding a bike: A seasoned cyclist might talk a beginner through the basics of how to sit and when to push off. But other skills, like how hard to pedal to keep ...

A University of Houston engineer has developed a method to detect possible damage in concealed cold-formed steel construction framing materials hidden behind walls, without having to tear the walls ...