Neil Tyler talks with Parasoft’s Ricardo Camacho, Director of Product Strategy Embedded & Safety Critical Compliance.

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

As this report about automation in quality assurance states, ensuring optimal test coverage is among the most arduous tasks in QA. This is because the calculation of this metric depends on a plethora ...

When developers and engineers measure code coverage in embedded systems they can improve their device’s safety and performance. Embedded systems play a foundational ...