Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...
System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
New liquid-cooling enabled system delivers affordable, high-density SLT and burn-in test for high-demand, lower-volume HPC, AI, and automotive devices TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading ...
The surge in data-rich applications shows no signs of slowing down, fueling significant evolution within the global semiconductor industry. This insatiable demand for data necessitates a comprehensive ...
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