About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

PARIS – Silicon Image Inc. announced it has licensed Synopsys' DFTMAX compression, an integral part of the Galaxy Implementation Platform, to reduce manufacturing test cost and time. Silicon Image ...

As IC design sizes continue to double every 18 to 24 months, those charged with testing the finished product are challenged on multiple fronts. Test-data volume and testing time are expanding, while ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

The specimen needs to be held properly during each test to provide safe and reliable testing with the production of results that are accurate. This can only be done if the specimen grip and test tool ...