This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
The ScanExpress boundary-scan tool suite version 7.8 includes improved cluster testing support, intelligent BSDL file handling, and a model-based test coverage. The suite also expands JTAG Embedded ...
Structural test is the foundation of the majority of IC production testing. The idea of structural test is that the entire chip operation doesn’t need to be known. Instead, the structural pieces and ...
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