SANTA CLARA, CA--(Marketwired - February 13, 2017) - Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997, just announced that Park SmartScan a powerful AFM operating software that ...
The collaboration combines NEC’s industry-leading software with HID’s best-in-class hardware for public safety and beyond This collaboration brings together NEC’s advanced SmartScan™ software and ...
IRVING, Texas--(BUSINESS WIRE)--NEC Corporation of America (NEC), a leading provider and integrator of advanced IT, communications, networking, public safety and biometric solutions, today announced ...
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