Boundary scan is well established in the industry, a fact strengthened by major ATE companies like Agilent Technologies and Teradyne that have added boundary scan capabilities to their in-circuit ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...