Environmentally friendly is a term rapidly invading the electronics industry. The electronic industry will be facing great challenges over the next few years as the solder used in electronic products ...

The study of lifetime distribution and reliability testing seeks to characterise the statistical behaviour of time-to-failure data for components and systems across a range of applications, from ...

Undaunted by the skyrocketing costs of new semiconductor fabs and the formidable hurdles facing the industry with each new technology node, leading IC manufacturers are continuing to strive for ...

As technology shrinks, Yield and Reliability (YAR) are major challenges of SoC (System on Chip) production. There are many techniques available for increasing YAR. YAR of devices depend on testing ...

Congratulations to alumnus Bryan Root (ElEngr’84), who was recently elevated to Institute of Electrical and Electronics Engineers Fellow for leadership in improving semiconductor reliability test ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

Testing methodology: George Touloupas, Director of Technology and Quality at CEA, gives a detailed account of the methodology behind pv magazine test, and explains the results from the first round of ...

iNEMI (International Electronics Manufacturing Initiative) has begun driving two collaborative efforts that will focus on reliability and testing issues for MEMS technologies. Using information ...