McFowland III, Edward, Skyler Speakman, and Daniel B. Neill. "Fast Generalized Subset Scan for Anomalous Pattern Detection." Art. 12. Journal of Machine Learning Research 14 (2013): 1533–1561.
Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...
The hyperpersonalization pattern is defined as using machine learning to develop a profile of each individual, and then having that profile learn and adapt over time for a wide variety of purposes ...
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