The system, developed by Panevo, a Canadian clear technology and manufacturing analytics company, reportedly achieved approximately 97% detection reliability with minimal false positives of Muskoka’s ...

Researchers from Northwestern University, University of Virginia, Carnegie Mellon University, and Argonne National Laboratory have made a significant advancement in defect detection and process ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Discover how Telit Cinterion and NVIDIA are transforming industrial automation with 5G-enabled AI visual inspection and ...

Foreign material recalls in dairy products can significantly undermine consumer trust and result in financial losses. A recent survey indicates that confidence in U.S. food safety has declined, ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...