With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it ...
The use of hierarchical DFT methods is growing as design size and complexity stresses memory requirements and design schedules. Hierarchical DFT divides the design into smaller pieces, creates test ...
The semiconductor industry continues to face numerous challenges as designs approach reticle limits, process nodes evolve and engineering resources become increasingly stretched. It is essential to ...
Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...
Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...
Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
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