AZoNano

A Guide to AFM Sample Preparation

Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...
Michigan Technological University

Origin AFM Sample Preparation

Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...
AZOM

Tapping AFM-IR Provides High-Resolution Chemical Imaging

Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...
Business Wire

Powerful AFM Offline Analysis Software Now Available for Oxford Instruments Asylum Research Jupiter XR Large-Sample Atomic Force Microscope

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force ...
Business Insider

Park Systems Introduces Park NX-TSH a High Resolution, Automated Tip Scanning Head (TSH) for Industrial Large Sample AFM at Semicon China and Semicon West

SANTA CLARA, Calif., June 23, 2020 /PRNewswire-PRWeb/ -- Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes (AFM) is announcing Park NX-TSH, automated Tip Scan Head for large ...